Coverart for item
The Resource 19th IEEE VLSI Test Symposium, 2001, Marina Del Rey, CA

19th IEEE VLSI Test Symposium, 2001, Marina Del Rey, CA

Label
19th IEEE VLSI Test Symposium, 2001, Marina Del Rey, CA
Title
19th IEEE VLSI Test Symposium, 2001, Marina Del Rey, CA
Subject
Genre
Language
eng
Summary
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc
Member of
Cataloging source
COO
Index
no index present
Intended audience
Scholarly & Professional
Intended audience source
IEEE Computer Society Press
Language note
English
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/subjectName
Integrated Circuits
Label
19th IEEE VLSI Test Symposium, 2001, Marina Del Rey, CA
Instantiates
Publication
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
812631233
Dimensions
unknown
Extent
1 online resource (456 pages)
Form of item
online
Isbn
9780769511221
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Specific material designation
remote
System control number
(OCoLC)812631233
Label
19th IEEE VLSI Test Symposium, 2001, Marina Del Rey, CA
Publication
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
812631233
Dimensions
unknown
Extent
1 online resource (456 pages)
Form of item
online
Isbn
9780769511221
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Specific material designation
remote
System control number
(OCoLC)812631233

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      38.946102 -92.330125
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