Coverart for item
The Resource 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Label
2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Title
2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Creator
Author
Subject
Genre
Language
eng
Summary
This volume includes 45 papers presented at the October 2000 symposium, covering yield analysis, modeling, and enhancement; fault tolerance interconnections and systems; reconfiguration and repair; error coding; online testing; testing and BIST techniques; and fault injection techniques and environments. The authors, professionals and academics from 18 different companies, offer papers on specific topics such as quality-effective repair of multichip module systems, evaluations of burst error recovery for VF arithmetic coding, and test cost minimization for Hybrid BIST. A thorough subject index is lacking. Annotation copyrighted by Book News, Inc., Portland, OR
Member of
Cataloging source
COO
Index
no index present
Language note
English
Literary form
non fiction
Nature of contents
dictionaries
http://bibfra.me/vocab/lite/organizationName
IEEE Computer Society Staff
http://library.link/vocab/subjectName
  • Integrated circuits
  • Fault-tolerant computing
  • Fault-tolerant computing
  • Integrated circuits
Label
2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Instantiates
Publication
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
812631497
Dimensions
unknown
Extent
1 online resource (438 pages)
Form of item
online
Isbn
9780769507194
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
9780769507194
Specific material designation
remote
System control number
(OCoLC)812631497
Label
2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Publication
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
812631497
Dimensions
unknown
Extent
1 online resource (438 pages)
Form of item
online
Isbn
9780769507194
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
9780769507194
Specific material designation
remote
System control number
(OCoLC)812631497

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      38.946102 -92.330125
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