Coverart for item
The Resource 2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings, sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society, (electronic resource)

2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings, sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society, (electronic resource)

Label
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
Title
2006 IEEE International Workshop on Memory Technology, Design, and Testing
Title remainder
2-4 August 2006, Taipei, Taiwan : proceedings
Statement of responsibility
sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society
Title variation
  • MTDT '06
  • Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing
Creator
Contributor
Subject
Genre
Language
eng
Cataloging source
DLC
Dewey number
621.39/732
LC call number
TK7895.M4
LC item number
I334 2006
http://bibfra.me/vocab/lite/meetingDate
2006
http://bibfra.me/vocab/lite/meetingName
IEEE International Workshop on Memory Technology, Design, and Testing
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Semiconductor storage devices
  • Random access memory
Label
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings, sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society, (electronic resource)
Instantiates
Publication
Note
"IEEE Computer Society order number P2572"--T.p. verso
Bibliography note
Includes bibliographical references and index
Control code
OCM1bookssj0000395447
Dimensions
28 cm.
Dimensions
unknown
Extent
xviii, 83 pages
Isbn
9780769525723
Isbn Type
(pbk.)
Lccn
2006285152
Other physical details
illustrations
Specific material designation
remote
System control number
(WaSeSS)ssj0000395447
Label
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings, sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society, (electronic resource)
Publication
Note
"IEEE Computer Society order number P2572"--T.p. verso
Bibliography note
Includes bibliographical references and index
Control code
OCM1bookssj0000395447
Dimensions
28 cm.
Dimensions
unknown
Extent
xviii, 83 pages
Isbn
9780769525723
Isbn Type
(pbk.)
Lccn
2006285152
Other physical details
illustrations
Specific material designation
remote
System control number
(WaSeSS)ssj0000395447

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