Coverart for item
The Resource 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis : 28-29 April 2009, (electronic resource)

2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis : 28-29 April 2009, (electronic resource)

Label
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis : 28-29 April 2009
Title
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
Title remainder
28-29 April 2009
Title variation
2009 Institute of Electrical and Electronics Engineers Circuits and Systems International Conference on Testing and Diagnosis
Creator
Subject
Genre
Language
eng
Cataloging source
WaSeSS
LC call number
QA76.6
http://bibfra.me/vocab/lite/meetingDate
2009
http://bibfra.me/vocab/lite/meetingName
IEEE Circuits and Systems International Conference on Testing and Diagnosis
http://library.link/vocab/subjectName
  • Computer programs
  • Automatic test equipment
Label
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis : 28-29 April 2009, (electronic resource)
Instantiates
Publication
Control code
OCM1bookssj0001967244
Dimensions
unknown
Extent
1 online resource (430 pages)
Isbn
9781424425877
Isbn Type
(print)
Specific material designation
remote
System control number
(WaSeSS)ssj0001967244
Label
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis : 28-29 April 2009, (electronic resource)
Publication
Control code
OCM1bookssj0001967244
Dimensions
unknown
Extent
1 online resource (430 pages)
Isbn
9781424425877
Isbn Type
(print)
Specific material designation
remote
System control number
(WaSeSS)ssj0001967244

Library Locations

    • Ellis LibraryBorrow it
      1020 Lowry Street, Columbia, MO, 65201, US
      38.944491 -92.326012
Processing Feedback ...