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The Resource 2014 IEEE 23rd Asian Test Symposium (ATS), (electronic resource)

2014 IEEE 23rd Asian Test Symposium (ATS), (electronic resource)

Label
2014 IEEE 23rd Asian Test Symposium (ATS)
Title
2014 IEEE 23rd Asian Test Symposium (ATS)
Creator
Author
Subject
Language
eng
Summary
Annotation:
Cataloging source
BIP US
Intended audience
Scholarly & Professional
Intended audience source
IEEE
http://bibfra.me/vocab/lite/organizationName
IEEE Staff
Summary expansion
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind
Label
2014 IEEE 23rd Asian Test Symposium (ATS), (electronic resource)
Instantiates
Publication
Control code
OCM1bookssj0001945284
Dimensions
unknown
Governing access note
Available for distribution in: USA
Isbn
9781479960316
Specific material designation
remote
System control number
(WaSeSS)ssj0001945284
Label
2014 IEEE 23rd Asian Test Symposium (ATS), (electronic resource)
Publication
Control code
OCM1bookssj0001945284
Dimensions
unknown
Governing access note
Available for distribution in: USA
Isbn
9781479960316
Specific material designation
remote
System control number
(WaSeSS)ssj0001945284

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