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The Resource 2017 International Conference of Microelectronic Test Structures (ICMTS), (electronic resource)

2017 International Conference of Microelectronic Test Structures (ICMTS), (electronic resource)

Label
2017 International Conference of Microelectronic Test Structures (ICMTS)
Title
2017 International Conference of Microelectronic Test Structures (ICMTS)
Creator
Author
Language
eng
Summary
Annotation:
Cataloging source
BIP US
Intended audience
Scholarly & Professional
Intended audience source
IEEE
http://bibfra.me/vocab/lite/organizationName
IEEE Staff
Summary expansion
The scope of this conference is to bring together designers and users of test structures to discuss recent developments and futures directions
Label
2017 International Conference of Microelectronic Test Structures (ICMTS), (electronic resource)
Instantiates
Publication
Control code
OCM1bookssj0001948646
Dimensions
unknown
Governing access note
Available for distribution in: USA
Isbn
9781509036165
Specific material designation
remote
System control number
(WaSeSS)ssj0001948646
Label
2017 International Conference of Microelectronic Test Structures (ICMTS), (electronic resource)
Publication
Control code
OCM1bookssj0001948646
Dimensions
unknown
Governing access note
Available for distribution in: USA
Isbn
9781509036165
Specific material designation
remote
System control number
(WaSeSS)ssj0001948646

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