Coverart for item
The Resource 20th Space Simulation Conference : the Changing Testing Paradigm, compiled by Joseph L. Stecher III, (microform)

20th Space Simulation Conference : the Changing Testing Paradigm, compiled by Joseph L. Stecher III, (microform)

Label
20th Space Simulation Conference : the Changing Testing Paradigm
Title
20th Space Simulation Conference
Title remainder
the Changing Testing Paradigm
Statement of responsibility
compiled by Joseph L. Stecher III
Title variation
  • Twentieth Space Simulation Conference
  • Changing Testing Paradigm
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
GPO
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1998
http://bibfra.me/vocab/lite/meetingName
Space Simulation Conference
http://library.link/vocab/relatedWorkOrContributorName
  • Stecher, Joseph
  • Goddard Space Flight Center
Series statement
NASA contractor report
Series volume
NASA/CR-1998-208598 PREPRINT
http://library.link/vocab/subjectName
  • Conferences
  • Contamination
  • Dynamic tests
  • Thermal simulation
  • Space environment simulation
Label
20th Space Simulation Conference : the Changing Testing Paradigm, compiled by Joseph L. Stecher III, (microform)
Instantiates
Publication
Note
Shipping list no.: 99-0474-M
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
41440931
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
1 volume
Form of item
microfiche
Generation
first generation master
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
http://library.link/vocab/ext/overdrive/overdriveId
19990009901
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
Label
20th Space Simulation Conference : the Changing Testing Paradigm, compiled by Joseph L. Stecher III, (microform)
Publication
Note
Shipping list no.: 99-0474-M
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
41440931
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
1 volume
Form of item
microfiche
Generation
first generation master
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
http://library.link/vocab/ext/overdrive/overdriveId
19990009901
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche

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      38.944491 -92.326012
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