The Resource Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)
Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)
Resource Information
The item Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.This item is available to borrow from 2 library branches.
Resource Information
The item Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.
This item is available to borrow from 2 library branches.
- Language
- eng
- Extent
- 1 online resource (2 volumes (xxi, 1643 pages))
- Note
- "Conference dedicated to the electronic test of devices, boards and systems--covering the complete cycle from design verification, design- for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement"--Preface
- Label
- Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
- Title
- Advanced measurement and test
- Title remainder
- selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
- Statement of responsibility
- edited by Yanwen Wu
- Title variation
-
- International Conference on Advanced Measurement and Test
- AMT 2010
- Advanced Measurement and Test X
- Language
- eng
- Cataloging source
- MUU
- Illustrations
- illustrations
- Index
- index present
- LC call number
- TA1
- LC item number
- .K5 v.439-440
- Literary form
- non fiction
- http://bibfra.me/vocab/lite/meetingDate
- 2010
- http://bibfra.me/vocab/lite/meetingName
- International Conference on Advanced Measurement and Test
- Nature of contents
-
- dictionaries
- bibliography
- http://library.link/vocab/relatedWorkOrContributorName
- Wu, Yanwen
- Series statement
- Key engineering materials,
- Series volume
- v. 439-440
- http://library.link/vocab/subjectName
-
- Electric measurements
- Electronic measurements
- Materials
- Label
- Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)
- Note
- "Conference dedicated to the electronic test of devices, boards and systems--covering the complete cycle from design verification, design- for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement"--Preface
- Bibliography note
- Includes bibliographical references and indexes
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Control code
- 670535635
- Extent
- 1 online resource (2 volumes (xxi, 1643 pages))
- Form of item
- online
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Other physical details
- illustrations.
- Specific material designation
- remote
- System control number
- (OCoLC)670535635
- Label
- Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)
- Note
- "Conference dedicated to the electronic test of devices, boards and systems--covering the complete cycle from design verification, design- for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement"--Preface
- Bibliography note
- Includes bibliographical references and indexes
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Control code
- 670535635
- Extent
- 1 online resource (2 volumes (xxi, 1643 pages))
- Form of item
- online
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Other physical details
- illustrations.
- Specific material designation
- remote
- System control number
- (OCoLC)670535635
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/portal/Advanced-measurement-and-test--selected-peer/cWRYOCnsRjk/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/portal/Advanced-measurement-and-test--selected-peer/cWRYOCnsRjk/">Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
