The Resource Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)

Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)

Label
Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
Title
Advanced measurement and test
Title remainder
selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
Statement of responsibility
edited by Yanwen Wu
Title variation
  • International Conference on Advanced Measurement and Test
  • AMT 2010
  • Advanced Measurement and Test X
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
MUU
Illustrations
illustrations
Index
index present
LC call number
TA1
LC item number
.K5 v.439-440
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2010
http://bibfra.me/vocab/lite/meetingName
International Conference on Advanced Measurement and Test
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Wu, Yanwen
Series statement
Key engineering materials,
Series volume
v. 439-440
http://library.link/vocab/subjectName
  • Electric measurements
  • Electronic measurements
  • Materials
Label
Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)
Instantiates
Publication
Note
"Conference dedicated to the electronic test of devices, boards and systems--covering the complete cycle from design verification, design- for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement"--Preface
Bibliography note
Includes bibliographical references and indexes
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
670535635
Extent
1 online resource (2 volumes (xxi, 1643 pages))
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations.
Specific material designation
remote
System control number
(OCoLC)670535635
Label
Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China, edited by Yanwen Wu, (electronic resource)
Publication
Note
"Conference dedicated to the electronic test of devices, boards and systems--covering the complete cycle from design verification, design- for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement"--Preface
Bibliography note
Includes bibliographical references and indexes
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
670535635
Extent
1 online resource (2 volumes (xxi, 1643 pages))
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations.
Specific material designation
remote
System control number
(OCoLC)670535635

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