Coverart for item
The Resource Advanced scanning electron microscopy and X-ray microanalysis, Dale Newbury [and others]

Advanced scanning electron microscopy and X-ray microanalysis, Dale Newbury [and others]

Label
Advanced scanning electron microscopy and X-ray microanalysis
Title
Advanced scanning electron microscopy and X-ray microanalysis
Statement of responsibility
Dale Newbury [and others]
Contributor
Subject
Language
eng
Cataloging source
JAV
Illustrations
  • illustrations
  • plates
Index
index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
Newbury, Dale E
http://library.link/vocab/subjectName
  • Scanning electron microscopes
  • X-ray microanalysis
  • Scanning electron microscopy
Label
Advanced scanning electron microscopy and X-ray microanalysis, Dale Newbury [and others]
Instantiates
Publication
Bibliography note
Includes bibliographies and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Modeling electron beam-specimen interactions -- SEM mircorcharacterization of semiconductors -- Electron channeling contrast in the SEM -- Magnetic contrast in the SEM -- Computer-aided imaging and interpretation -- Alternative microanalytical techniques -- Specimen coating -- Advances in specimen preparation for biological SEM -- Cryomicroscopy
Control code
14174776
Dimensions
24 cm
Extent
xii, 454 pages 4 unnumbered pages of plates
Isbn
9780306421402
Lccn
85028261
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations (some color)
System control number
(WaOLN)886234
Label
Advanced scanning electron microscopy and X-ray microanalysis, Dale Newbury [and others]
Publication
Bibliography note
Includes bibliographies and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Modeling electron beam-specimen interactions -- SEM mircorcharacterization of semiconductors -- Electron channeling contrast in the SEM -- Magnetic contrast in the SEM -- Computer-aided imaging and interpretation -- Alternative microanalytical techniques -- Specimen coating -- Advances in specimen preparation for biological SEM -- Cryomicroscopy
Control code
14174776
Dimensions
24 cm
Extent
xii, 454 pages 4 unnumbered pages of plates
Isbn
9780306421402
Lccn
85028261
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations (some color)
System control number
(WaOLN)886234

Library Locations

    • Ellis LibraryBorrow it
      1020 Lowry Street, Columbia, MO, 65201, US
      38.944491 -92.326012
Processing Feedback ...