Coverart for item
The Resource Atomic force microscopy : understanding basic modes and advanced applications, Greg Haugstad

Atomic force microscopy : understanding basic modes and advanced applications, Greg Haugstad

Label
Atomic force microscopy : understanding basic modes and advanced applications
Title
Atomic force microscopy
Title remainder
understanding basic modes and advanced applications
Statement of responsibility
Greg Haugstad
Creator
Author
Subject
Language
eng
Summary
"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions"--Publisher's description
Cataloging source
DLC
http://library.link/vocab/creatorDate
1963-
http://library.link/vocab/creatorName
Haugstad, Greg
Dewey number
620/.5
Illustrations
illustrations
Index
index present
LC call number
QH212.A78
LC item number
H38 2012
Literary form
non fiction
Nature of contents
bibliography
NLM call number
QH 212.A78
http://library.link/vocab/subjectName
  • Atomic force microscopy
  • Microscopy, Atomic Force
Label
Atomic force microscopy : understanding basic modes and advanced applications, Greg Haugstad
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier.
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent.
Contents
Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation
Control code
682892479
Dimensions
25 cm
Extent
xxii, 464 pages
Isbn
9780470638828
Lccn
2012003429
Media category
unmediated
Media MARC source
rdamedia.
Media type code
  • n
Other physical details
illustrations
System control number
(OCoLC)682892479
Label
Atomic force microscopy : understanding basic modes and advanced applications, Greg Haugstad
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier.
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent.
Contents
Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation
Control code
682892479
Dimensions
25 cm
Extent
xxii, 464 pages
Isbn
9780470638828
Lccn
2012003429
Media category
unmediated
Media MARC source
rdamedia.
Media type code
  • n
Other physical details
illustrations
System control number
(OCoLC)682892479

Library Locations

    • J. Otto Lottes Health Sciences LibraryBorrow it
      1 Hospital Dr, Columbia, MO, 65201, US
      38.939544 -92.328377
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