The Resource Built-in test for VLSI : pseudorandom techniques, Paul H. Bardell, William H. McAnney, Jacob Savir

Built-in test for VLSI : pseudorandom techniques, Paul H. Bardell, William H. McAnney, Jacob Savir

Label
Built-in test for VLSI : pseudorandom techniques
Title
Built-in test for VLSI
Title remainder
pseudorandom techniques
Statement of responsibility
Paul H. Bardell, William H. McAnney, Jacob Savir
Creator
Contributor
Subject
Language
eng
Action
digitized
Cataloging source
OCLCE
http://library.link/vocab/creatorName
Bardell, Paul H
Dewey number
621.381/73
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.B374 1987
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • McAnney, William H
  • Savir, Jacob
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
Label
Built-in test for VLSI : pseudorandom techniques, Paul H. Bardell, William H. McAnney, Jacob Savir
Instantiates
Publication
Antecedent source
file reproduced from original
Bibliography note
Includes bibliographical references (pages 339-345) and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Digital testing and the need for testable design -- Principles of testable design -- Pseudorandom sequence generators -- Test response compression techniques -- Shift-register polynomial division -- Special-purpose shift-register circuits -- Random pattern built-in test -- Built-in test structures -- Limitations and other concerns of random pattern testing -- Test system requirements for built-in test -- Appendix -- References -- Index
Control code
568760167
Dimensions
unknown
Extent
1 online resource (xiii, 354 pages)
Form of item
online
Level of compression
  • lossless
  • lossy
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000215
Reformatting quality
  • preservation
  • access
Reproduction note
Electronic reproduction.
Specific material designation
remote
System control number
(OCoLC)568760167
System details
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Label
Built-in test for VLSI : pseudorandom techniques, Paul H. Bardell, William H. McAnney, Jacob Savir
Publication
Antecedent source
file reproduced from original
Bibliography note
Includes bibliographical references (pages 339-345) and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Digital testing and the need for testable design -- Principles of testable design -- Pseudorandom sequence generators -- Test response compression techniques -- Shift-register polynomial division -- Special-purpose shift-register circuits -- Random pattern built-in test -- Built-in test structures -- Limitations and other concerns of random pattern testing -- Test system requirements for built-in test -- Appendix -- References -- Index
Control code
568760167
Dimensions
unknown
Extent
1 online resource (xiii, 354 pages)
Form of item
online
Level of compression
  • lossless
  • lossy
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000215
Reformatting quality
  • preservation
  • access
Reproduction note
Electronic reproduction.
Specific material designation
remote
System control number
(OCoLC)568760167
System details
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.

Library Locations

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      38.946102 -92.330125
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