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The Resource Combined analysis, Daniel Chateigner

Combined analysis, Daniel Chateigner

Label
Combined analysis
Title
Combined analysis
Statement of responsibility
Daniel Chateigner
Creator
Subject
Language
eng
Summary
  • This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analysis in a single approach. --
  • The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing - a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed. --
  • Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses. --
  • This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology. --Book Jacket
Cataloging source
DLC
http://library.link/vocab/creatorName
Chateigner, Daniel
Dewey number
548/.83
Illustrations
illustrations
Index
index present
LC call number
QD75.3
LC item number
.C45 2010
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/subjectName
  • Chemistry, Analytic
  • Solid state chemistry
  • Crystals
Label
Combined analysis, Daniel Chateigner
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Some basic notions about powder diffraction -- Structure refinement by diffraction profile adjustment (Rietveld method) -- Automatic indexing of powder diagrams -- Quantitative texture analysis -- Quantitative microstructure analysis -- Quantitative phase analysis -- Residual strain-stress analysis -- X-ray reflectivity -- Combined structure-texture-microstructure-stress-phase reflectivity analysis -- Macroscopic anisotropic properties
Control code
500823573
Dimensions
24 cm
Extent
xviii, 497 pages
Isbn
9781848211988
Lccn
2010012973
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations
System control number
(OCoLC)500823573
Label
Combined analysis, Daniel Chateigner
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Some basic notions about powder diffraction -- Structure refinement by diffraction profile adjustment (Rietveld method) -- Automatic indexing of powder diagrams -- Quantitative texture analysis -- Quantitative microstructure analysis -- Quantitative phase analysis -- Residual strain-stress analysis -- X-ray reflectivity -- Combined structure-texture-microstructure-stress-phase reflectivity analysis -- Macroscopic anisotropic properties
Control code
500823573
Dimensions
24 cm
Extent
xviii, 497 pages
Isbn
9781848211988
Lccn
2010012973
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations
System control number
(OCoLC)500823573

Library Locations

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      1020 Lowry Street, Columbia, MO, 65201, US
      38.944491 -92.326012
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