The Resource DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA, edited by Robert Aitken [and others] ; sponsored by the IEEE Computer Society Test Technology Technical Council [and the] IEEE Computer Society Technical Committee on Fault-Tolerant Computing

DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA, edited by Robert Aitken [and others] ; sponsored by the IEEE Computer Society Test Technology Technical Council [and the] IEEE Computer Society Technical Committee on Fault-Tolerant Computing

Label
DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA
Title
DFT 2005
Title remainder
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA
Statement of responsibility
edited by Robert Aitken [and others] ; sponsored by the IEEE Computer Society Test Technology Technical Council [and the] IEEE Computer Society Technical Committee on Fault-Tolerant Computing
Title variation
  • International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Defect and fault tolerance in VLSI systems
  • Defect and Fault Tolerance in VLSI Systems, 2005, DFT 2005, 20th IEEE International Symposium on
  • 20th IEEE International Symposium on Defect and Fault Tolernce in VLSI Systems
Creator
Contributor
Subject
Genre
Language
eng
Summary
Annotation
Member of
Cataloging source
AZU
Illustrations
illustrations
Index
index present
LC call number
TK7874
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2005
http://bibfra.me/vocab/lite/meetingName
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Aitken, Robert
  • IEEE Computer Society
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Fault-tolerant computing
  • Fault-tolerant computing
  • Integrated circuits
Summary expansion
DFT 2005 showcases the latest research results on yield analysis and modeling, scan design and test data compression, reconfiguration, error correcting codes and circuits, and fault detection and tolerance for sensor and flash memory. Its also covers delay fault test and timing consideration, interconnect test, approaches for soft error, on-line and concurrent fault detection, fault and error tolerant systems, and test scheduling and software-based test
Label
DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA, edited by Robert Aitken [and others] ; sponsored by the IEEE Computer Society Test Technology Technical Council [and the] IEEE Computer Society Technical Committee on Fault-Tolerant Computing
Instantiates
Publication
Note
"IEEE Computer Society Order Number P2464"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
62476279
Dimensions
unknown
Extent
1 online resource (xii, 602 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)62476279
Label
DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA, edited by Robert Aitken [and others] ; sponsored by the IEEE Computer Society Test Technology Technical Council [and the] IEEE Computer Society Technical Committee on Fault-Tolerant Computing
Publication
Note
"IEEE Computer Society Order Number P2464"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
62476279
Dimensions
unknown
Extent
1 online resource (xii, 602 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)62476279

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