Coverart for item
The Resource IEEE International High-Level Design Validation and Test Workshop : Proceedings, 8-10 November 2000, Berkeley, California, (electronic resource:)

IEEE International High-Level Design Validation and Test Workshop : Proceedings, 8-10 November 2000, Berkeley, California, (electronic resource:)

Label
IEEE International High-Level Design Validation and Test Workshop : Proceedings, 8-10 November 2000, Berkeley, California
Title
IEEE International High-Level Design Validation and Test Workshop
Title remainder
Proceedings, 8-10 November 2000, Berkeley, California
Creator
Contributor
Other
Subject
Language
eng
Summary
Annotation:
Cataloging source
BIP US
Citation source
Sci-Tech BIP
http://bibfra.me/vocab/relation/contributionby
EI7owJxlKIE
Dewey number
621.39/16
Intended audience
Scholarly & Professional
Intended audience source
IEEE Computer Society Press
LC call number
TK7895.M5F34 2000
http://bibfra.me/vocab/lite/organizationName
IEEE Computer Society, Technical Council on Test Technology Staff
http://library.link/vocab/relatedWorkOrContributorName
IEEE Computer Society, Design Automation Technical Committee Staff
Summary expansion
Proceedings of a November 2000 workshop, with papers in sections on advances in high-level test, validation and test for microprocessor designs, hardware/software co-validation, formal verification techniques and applications, issues in high-level design validation, formal verification techniques, and advances in simulation-based verification. Specific topics include hardware/software co-debugging for reconfigurable computing, statistical behavior of branch coverage in testing behavioral VHDL models, system level testability analysis using Petri nets, and data flow based cache prediction using local simulation. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR
Label
IEEE International High-Level Design Validation and Test Workshop : Proceedings, 8-10 November 2000, Berkeley, California, (electronic resource:)
Instantiates
Publication
Control code
OCM1bookssj0000450978
Dimensions
28.000 x 022.000 cm.
Dimensions
unknown
Extent
x, 179 pages
Governing access note
Available for distribution in: USA, UNITED KINGDOM
Isbn
9780769507866
Lccn
00110249
Other control number
9780769507866
Other physical details
ill
Specific material designation
remote
System control number
(WaSeSS)ssj0000450978
Label
IEEE International High-Level Design Validation and Test Workshop : Proceedings, 8-10 November 2000, Berkeley, California, (electronic resource:)
Publication
Control code
OCM1bookssj0000450978
Dimensions
28.000 x 022.000 cm.
Dimensions
unknown
Extent
x, 179 pages
Governing access note
Available for distribution in: USA, UNITED KINGDOM
Isbn
9780769507866
Lccn
00110249
Other control number
9780769507866
Other physical details
ill
Specific material designation
remote
System control number
(WaSeSS)ssj0000450978

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