Coverart for item
The Resource Ionizing radiation effects in electronics : from memories to imagers, edited by Marta Bagatin, Simone Gerardin

Ionizing radiation effects in electronics : from memories to imagers, edited by Marta Bagatin, Simone Gerardin

Label
Ionizing radiation effects in electronics : from memories to imagers
Title
Ionizing radiation effects in electronics
Title remainder
from memories to imagers
Statement of responsibility
edited by Marta Bagatin, Simone Gerardin
Contributor
Editor
Subject
Genre
Language
eng
Member of
Cataloging source
N$T
Dewey number
621.4
Illustrations
illustrations
Index
index present
LC call number
QC794.95
LC item number
.I66 2016
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Bagatin, Marta
  • Gerardin, Simone
Series statement
Devices, circuits, and systems
http://library.link/vocab/subjectName
  • Ionizing radiation
  • TECHNOLOGY & ENGINEERING
  • Ionizing radiation
Label
Ionizing radiation effects in electronics : from memories to imagers, edited by Marta Bagatin, Simone Gerardin
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Front Cover; Contents; Preface; Editors; Contributors; Chapter 1: Introduction to the Effects of Radiation on Electronic Devices; Chapter 2: Monte Carlo Simulation of Radiation Effects; Chapter 3: A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies; Chapter 4: Radiation Effects in DRAMs; Chapter 5: Radiation Effects in Flash Memories; Chapter 6: Microprocessor Radiation Effects; Chapter 7: Soft-Error Hardened Latch and Flip-Flop Design; Chapter 8: Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs
  • Chapter 9: Single-Event Mitigation Techniques for Analog and Mixed-Signal CircuitsChapter 10: CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics : TID Effects and Bulk Damage Study; Chapter 11: Radiation Effects on CMOS Active Pixel Image Sensors; Chapter 12: Natural Radiation Effects in CCD Devices; Chapter 13: Radiation Effects on Optical Fibers and Fiber-Based Sensors; Back Cover
Control code
929951542
Dimensions
unknown
Extent
1 online resource (xviii, 391 pages)
File format
unknown
Form of item
online
Isbn
9781498722636
Lccn
2016285058
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations.
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000714
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)929951542
Label
Ionizing radiation effects in electronics : from memories to imagers, edited by Marta Bagatin, Simone Gerardin
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Front Cover; Contents; Preface; Editors; Contributors; Chapter 1: Introduction to the Effects of Radiation on Electronic Devices; Chapter 2: Monte Carlo Simulation of Radiation Effects; Chapter 3: A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies; Chapter 4: Radiation Effects in DRAMs; Chapter 5: Radiation Effects in Flash Memories; Chapter 6: Microprocessor Radiation Effects; Chapter 7: Soft-Error Hardened Latch and Flip-Flop Design; Chapter 8: Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs
  • Chapter 9: Single-Event Mitigation Techniques for Analog and Mixed-Signal CircuitsChapter 10: CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics : TID Effects and Bulk Damage Study; Chapter 11: Radiation Effects on CMOS Active Pixel Image Sensors; Chapter 12: Natural Radiation Effects in CCD Devices; Chapter 13: Radiation Effects on Optical Fibers and Fiber-Based Sensors; Back Cover
Control code
929951542
Dimensions
unknown
Extent
1 online resource (xviii, 391 pages)
File format
unknown
Form of item
online
Isbn
9781498722636
Lccn
2016285058
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations.
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000714
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)929951542

Library Locations

    • Ellis LibraryBorrow it
      1020 Lowry Street, Columbia, MO, 65201, US
      38.944491 -92.326012
    • Engineering Library & Technology CommonsBorrow it
      W2001 Lafferre Hall, Columbia, MO, 65211, US
      38.946102 -92.330125
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