The Resource Metallization of polymers 2, edited by Edward Sacher
Metallization of polymers 2, edited by Edward Sacher
Resource Information
The item Metallization of polymers 2, edited by Edward Sacher represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.This item is available to borrow from 2 library branches.
Resource Information
The item Metallization of polymers 2, edited by Edward Sacher represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.
This item is available to borrow from 2 library branches.
- Language
- eng
- Extent
- viii, 208 pages
- Contents
-
- M. Seto, B. Dick, M. Brett
- Low Permittivity Materials
- Physical and Interfacial Properties of Low Permittivity Polymers: Cyclotene, SiLK and Ultra-Low K
- D. Frye, J.J. Waeterloos, M. Simmonds, T. Stokich, J. Im
- Mechanical Properties of Cured Silk Low-K Dielectric Films
- J. Im, P.H. Townsend, J. Curphy, C. Karas, E.O. Shaffer II
- Plasma-Polymerized Fluoropolymer Thin Films for Microelectronic Applications
- M. Silverstein, R. Chen, E. Sacher, L. Sandrin
- Polymer Metallization
- Fundamental Aspects of Polymer Metallization
- New Instrumentation
- F. Faupel, V. Zaporojtchenko, T. Strunskus, J. Erichsen, K. Dolgner, A. Thran, M. Keine
- The Study of Copper Clusters on Dow Cyclotene and Their Stability
- D.-Q. Yang, E. Sacher
- Adsorption of Noble Metal Atoms on Polymers
- V. Zaporojtchenko, J. Erichsen, J. Zekonyte, A. Thran, T. Strunskus, F. Faupel
- Nucleation and Growth of Vapor-Deposited Metal Films on Self-Assembled Monolayers Studied by Multiple Characterization Probes
- A.V. Walker, G.L. Fisher, A.E. Hooper, T. Tighe, R. Opila, N. Winograd, D.L. Allara
- Barrier Layers
- Surface Analysis Using Confocal Raman Micro-spectroscopy
- C. Hyett, D.-Q. Yang, T.H. Ellis, E. Sacher
- Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle
- D. Dalacu, L. Martinu
- Ultra Thin Film Analysis Using the Thermo VG Scientifics Thetaprobe Instrument
- R.K. Champaneria, J. Wolstenholme
- Nanoindentation of Microsprings and Microcantilevers
- Isbn
- 9780306472534
- Label
- Metallization of polymers 2
- Title
- Metallization of polymers 2
- Statement of responsibility
- edited by Edward Sacher
- Language
- eng
- Cataloging source
- DLC
- Dewey number
- 668.9
- Illustrations
- illustrations
- Index
- index present
- LC call number
- TA491
- LC item number
- .M463 2002
- Literary form
- non fiction
- NAL call number
- TA491
- NAL item number
- .M463 2002
- Nature of contents
- bibliography
- http://library.link/vocab/relatedWorkOrContributorDate
- 1934-
- http://library.link/vocab/relatedWorkOrContributorName
- Sacher, Edward
- http://library.link/vocab/subjectName
-
- Metal coating
- Polymers
- Metallizing
- Label
- Metallization of polymers 2, edited by Edward Sacher
- Bibliography note
- Includes bibliographical references and index
- Carrier category
- volume
- Carrier category code
-
- nc
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Contents
-
- M. Seto, B. Dick, M. Brett
- Low Permittivity Materials
- Physical and Interfacial Properties of Low Permittivity Polymers: Cyclotene, SiLK and Ultra-Low K
- D. Frye, J.J. Waeterloos, M. Simmonds, T. Stokich, J. Im
- Mechanical Properties of Cured Silk Low-K Dielectric Films
- J. Im, P.H. Townsend, J. Curphy, C. Karas, E.O. Shaffer II
- Plasma-Polymerized Fluoropolymer Thin Films for Microelectronic Applications
- M. Silverstein, R. Chen, E. Sacher, L. Sandrin
- Polymer Metallization
- Fundamental Aspects of Polymer Metallization
- New Instrumentation
- F. Faupel, V. Zaporojtchenko, T. Strunskus, J. Erichsen, K. Dolgner, A. Thran, M. Keine
- The Study of Copper Clusters on Dow Cyclotene and Their Stability
- D.-Q. Yang, E. Sacher
- Adsorption of Noble Metal Atoms on Polymers
- V. Zaporojtchenko, J. Erichsen, J. Zekonyte, A. Thran, T. Strunskus, F. Faupel
- Nucleation and Growth of Vapor-Deposited Metal Films on Self-Assembled Monolayers Studied by Multiple Characterization Probes
- A.V. Walker, G.L. Fisher, A.E. Hooper, T. Tighe, R. Opila, N. Winograd, D.L. Allara
- Barrier Layers
- Surface Analysis Using Confocal Raman Micro-spectroscopy
- C. Hyett, D.-Q. Yang, T.H. Ellis, E. Sacher
- Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle
- D. Dalacu, L. Martinu
- Ultra Thin Film Analysis Using the Thermo VG Scientifics Thetaprobe Instrument
- R.K. Champaneria, J. Wolstenholme
- Nanoindentation of Microsprings and Microcantilevers
- Control code
- 49285731
- Dimensions
- 26 cm
- Extent
- viii, 208 pages
- Isbn
- 9780306472534
- Lccn
- 2002022134
- Media category
- unmediated
- Media MARC source
- rdamedia
- Media type code
-
- n
- Other physical details
- illustrations
- Label
- Metallization of polymers 2, edited by Edward Sacher
- Bibliography note
- Includes bibliographical references and index
- Carrier category
- volume
- Carrier category code
-
- nc
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Contents
-
- M. Seto, B. Dick, M. Brett
- Low Permittivity Materials
- Physical and Interfacial Properties of Low Permittivity Polymers: Cyclotene, SiLK and Ultra-Low K
- D. Frye, J.J. Waeterloos, M. Simmonds, T. Stokich, J. Im
- Mechanical Properties of Cured Silk Low-K Dielectric Films
- J. Im, P.H. Townsend, J. Curphy, C. Karas, E.O. Shaffer II
- Plasma-Polymerized Fluoropolymer Thin Films for Microelectronic Applications
- M. Silverstein, R. Chen, E. Sacher, L. Sandrin
- Polymer Metallization
- Fundamental Aspects of Polymer Metallization
- New Instrumentation
- F. Faupel, V. Zaporojtchenko, T. Strunskus, J. Erichsen, K. Dolgner, A. Thran, M. Keine
- The Study of Copper Clusters on Dow Cyclotene and Their Stability
- D.-Q. Yang, E. Sacher
- Adsorption of Noble Metal Atoms on Polymers
- V. Zaporojtchenko, J. Erichsen, J. Zekonyte, A. Thran, T. Strunskus, F. Faupel
- Nucleation and Growth of Vapor-Deposited Metal Films on Self-Assembled Monolayers Studied by Multiple Characterization Probes
- A.V. Walker, G.L. Fisher, A.E. Hooper, T. Tighe, R. Opila, N. Winograd, D.L. Allara
- Barrier Layers
- Surface Analysis Using Confocal Raman Micro-spectroscopy
- C. Hyett, D.-Q. Yang, T.H. Ellis, E. Sacher
- Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle
- D. Dalacu, L. Martinu
- Ultra Thin Film Analysis Using the Thermo VG Scientifics Thetaprobe Instrument
- R.K. Champaneria, J. Wolstenholme
- Nanoindentation of Microsprings and Microcantilevers
- Control code
- 49285731
- Dimensions
- 26 cm
- Extent
- viii, 208 pages
- Isbn
- 9780306472534
- Lccn
- 2002022134
- Media category
- unmediated
- Media MARC source
- rdamedia
- Media type code
-
- n
- Other physical details
- illustrations
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/portal/Metallization-of-polymers-2-edited-by-Edward/2iysxaNeuqo/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/portal/Metallization-of-polymers-2-edited-by-Edward/2iysxaNeuqo/">Metallization of polymers 2, edited by Edward Sacher</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
