Coverart for item
The Resource Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test, (electronic resource)

Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test, (electronic resource)

Label
Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test
Title
Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test
Title variation
  • IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)
  • International Symposium on VLSI Design, Automation & Test
  • VLSI-DAT ..
  • Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation & Test
Creator
Contributor
Subject
Genre
Continues
Cataloging source
DLC
Dewey number
621
http://bibfra.me/vocab/lite/meetingName
International Symposium on VLSI Design, Automation, and Test
http://library.link/vocab/relatedWorkOrContributorName
  • Institute of Electrical and Electronics Engineers
  • IEEE Xplore (Online service)
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
Label
Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test, (electronic resource)
Instantiates
Publication
Abbreviated title
Proc. Tech. Program Int. Symp. VLSI Des. Autom. Test
Control code
OCM1ssj0001616384
Governing access note
Available only to authorized users
Issn
2472-9124
Key title
Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test
Lccn
2016202348
Publication designation
Began with: 2005.
Publication frequency
Annual
System control number
(WaSeSS)ssj0001616384
Label
Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test, (electronic resource)
Publication
Abbreviated title
Proc. Tech. Program Int. Symp. VLSI Des. Autom. Test
Control code
OCM1ssj0001616384
Governing access note
Available only to authorized users
Issn
2472-9124
Key title
Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test
Lccn
2016202348
Publication designation
Began with: 2005.
Publication frequency
Annual
System control number
(WaSeSS)ssj0001616384

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