The Resource Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu
Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu
Resource Information
The item Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.This item is available to borrow from 2 library branches.
Resource Information
The item Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.
This item is available to borrow from 2 library branches.
- Summary
- This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits
- Language
- eng
- Extent
- 1 online resource
- Contents
-
- Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing
- Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices
- Isbn
- 9781466590847
- Label
- Soft errors : from particles to circuits
- Title
- Soft errors
- Title remainder
- from particles to circuits
- Statement of responsibility
- Jean-Luc Autran, Daniela Munteanu
- Language
- eng
- Summary
- This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits
- Cataloging source
- N$T
- http://library.link/vocab/creatorDate
- 1969-
- http://library.link/vocab/creatorName
- Autran, Jean-Luc
- Dewey number
- 363.7387
- Illustrations
- illustrations
- Index
- index present
- LC call number
- QC912.3
- Literary form
- non fiction
- Nature of contents
-
- dictionaries
- bibliography
- http://library.link/vocab/relatedWorkOrContributorName
- Munteanu, Daniela
- Series statement
- Devices, circuits, and systems
- http://library.link/vocab/subjectName
-
- Soft errors (Computer science)
- Atmospheric radiation
- Cosmic rays
- Particles
- BUSINESS & ECONOMICS
- SOCIAL SCIENCE
- Atmospheric radiation
- Cosmic rays
- Particles
- Soft errors (Computer science)
- Label
- Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu
- Antecedent source
- unknown
- Bibliography note
- Includes bibliographical reference and index
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Color
- multicolored
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Contents
-
- Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing
- Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices
- Control code
- 903644086
- Dimensions
- unknown
- Extent
- 1 online resource
- File format
- unknown
- Form of item
- online
- Isbn
- 9781466590847
- Level of compression
- unknown
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Other physical details
- illustrations
- http://library.link/vocab/ext/overdrive/overdriveId
- tandf_306253
- Quality assurance targets
- not applicable
- Reformatting quality
- unknown
- Sound
- unknown sound
- Specific material designation
- remote
- System control number
- (OCoLC)903644086
- Label
- Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu
- Antecedent source
- unknown
- Bibliography note
- Includes bibliographical reference and index
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Color
- multicolored
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Contents
-
- Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing
- Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices
- Control code
- 903644086
- Dimensions
- unknown
- Extent
- 1 online resource
- File format
- unknown
- Form of item
- online
- Isbn
- 9781466590847
- Level of compression
- unknown
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Other physical details
- illustrations
- http://library.link/vocab/ext/overdrive/overdriveId
- tandf_306253
- Quality assurance targets
- not applicable
- Reformatting quality
- unknown
- Sound
- unknown sound
- Specific material designation
- remote
- System control number
- (OCoLC)903644086
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/portal/Soft-errors--from-particles-to-circuits/orOCU_U-mU4/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/portal/Soft-errors--from-particles-to-circuits/orOCU_U-mU4/">Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
