Coverart for item
The Resource Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu

Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu

Label
Soft errors : from particles to circuits
Title
Soft errors
Title remainder
from particles to circuits
Statement of responsibility
Jean-Luc Autran, Daniela Munteanu
Creator
Contributor
Author
Subject
Genre
Language
eng
Summary
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits
Member of
Cataloging source
N$T
http://library.link/vocab/creatorDate
1969-
http://library.link/vocab/creatorName
Autran, Jean-Luc
Dewey number
363.7387
Illustrations
illustrations
Index
index present
LC call number
QC912.3
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Munteanu, Daniela
Series statement
Devices, circuits, and systems
http://library.link/vocab/subjectName
  • Soft errors (Computer science)
  • Atmospheric radiation
  • Cosmic rays
  • Particles
  • BUSINESS & ECONOMICS
  • SOCIAL SCIENCE
  • Atmospheric radiation
  • Cosmic rays
  • Particles
  • Soft errors (Computer science)
Label
Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical reference and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing
  • Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices
Control code
903644086
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9781466590847
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
tandf_306253
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)903644086
Label
Soft errors : from particles to circuits, Jean-Luc Autran, Daniela Munteanu
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical reference and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing
  • Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices
Control code
903644086
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9781466590847
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
tandf_306253
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)903644086

Library Locations

    • Ellis LibraryBorrow it
      1020 Lowry Street, Columbia, MO, 65201, US
      38.944491 -92.326012
    • Engineering Library & Technology CommonsBorrow it
      W2001 Lafferre Hall, Columbia, MO, 65211, US
      38.946102 -92.330125
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