Coverart for item
The Resource Testing for small-delay defects in nanoscale CMOS integrated circuits, edited by Sandeep K. Goel, Krishnendu Chakrabarty

Testing for small-delay defects in nanoscale CMOS integrated circuits, edited by Sandeep K. Goel, Krishnendu Chakrabarty

Label
Testing for small-delay defects in nanoscale CMOS integrated circuits
Title
Testing for small-delay defects in nanoscale CMOS integrated circuits
Statement of responsibility
edited by Sandeep K. Goel, Krishnendu Chakrabarty
Contributor
Editor
Subject
Genre
Language
eng
Summary
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay
Member of
Cataloging source
CUS
Dewey number
621.39/732
Illustrations
illustrations
Index
index present
LC call number
TK7871.99.M44
LC item number
T43 2014eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Goel, Sandeep K.
  • Chakrabarty, Krishnendu
Series statement
Devices, circuits, and systems
http://library.link/vocab/subjectName
  • Metal oxide semiconductors, Complementary
  • TECHNOLOGY & ENGINEERING
  • Metal oxide semiconductors, Complementary
Label
Testing for small-delay defects in nanoscale CMOS integrated circuits, edited by Sandeep K. Goel, Krishnendu Chakrabarty
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics
Control code
859916982
Dimensions
unknown
Extent
1 online resource (xv, 247 pages)
Form of item
online
Isbn
9781439829424
Lccn
2013028538
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000527
Specific material designation
remote
System control number
(OCoLC)859916982
Label
Testing for small-delay defects in nanoscale CMOS integrated circuits, edited by Sandeep K. Goel, Krishnendu Chakrabarty
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics
Control code
859916982
Dimensions
unknown
Extent
1 online resource (xv, 247 pages)
Form of item
online
Isbn
9781439829424
Lccn
2013028538
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000527
Specific material designation
remote
System control number
(OCoLC)859916982

Library Locations

    • Ellis LibraryBorrow it
      1020 Lowry Street, Columbia, MO, 65201, US
      38.944491 -92.326012
    • Engineering Library & Technology CommonsBorrow it
      W2001 Lafferre Hall, Columbia, MO, 65211, US
      38.946102 -92.330125
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