Coverart for item
The Resource Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia, edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.], (electronic resource)

Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia, edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.], (electronic resource)

Label
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Title
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Statement of responsibility
edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.]
Title variation
  • DELTA 2006
  • International Workshop on Electronic Design, Test, and Applications
  • Electronic Design, Test and Applications
Creator
Contributor
Subject
Genre
Language
eng
Cataloging source
IXA
Dewey number
621.381
LC call number
TK7874
LC item number
.I3237 2006
http://bibfra.me/vocab/lite/meetingDate
2006
http://bibfra.me/vocab/lite/meetingName
IEEE International Workshop on Electronic Design, Test and Applications
http://library.link/vocab/relatedWorkOrContributorName
  • Girard, Patrick
  • Osseiran, Adam
  • Chew, Moi-Tin
  • IEEE Computer Society
  • IEEE Malaysia Section
  • Monash University Malaysia
  • National Instruments (Firm)
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
  • Microelectronics
  • Microelectronics
Label
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia, edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.], (electronic resource)
Instantiates
Publication
Note
"IEEE Computer Society Order Number P2500"--T.p. verso
Bibliography note
Includes bibliographical references and index
Control code
OCM1bookssj0000394403
Dimensions
28 cm.
Dimensions
unknown
Extent
xvii, 521 pages
Isbn
9780769525006
Lccn
2005935111
Other physical details
illustrations
Specific material designation
remote
System control number
(WaSeSS)ssj0000394403
Label
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia, edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.], (electronic resource)
Publication
Note
"IEEE Computer Society Order Number P2500"--T.p. verso
Bibliography note
Includes bibliographical references and index
Control code
OCM1bookssj0000394403
Dimensions
28 cm.
Dimensions
unknown
Extent
xvii, 521 pages
Isbn
9780769525006
Lccn
2005935111
Other physical details
illustrations
Specific material designation
remote
System control number
(WaSeSS)ssj0000394403

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