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The Resource VLSI Test Symposium, 12th IEEE, (electronic resource)

VLSI Test Symposium, 12th IEEE, (electronic resource)

Label
VLSI Test Symposium, 12th IEEE
Title
VLSI Test Symposium, 12th IEEE
Subject
Language
eng
Summary
Annotation:
Cataloging source
BIP US
Citation source
Sci-Tech BIP
Summary expansion
Proceedings of the symposium held in Cherry Hill, New Jersey, April 1994. Technical sessions are devoted to synthesis and testability; testable mixed-signal circuit designs; built-in self-test; test generation and fault simulation; on-line testing; defect coverage and test quality; advanced test generation techniques; high-level mixed-signal test issues; delay fault testing; testing regular structures; design verification and manufacturing validation; IDDQ testing and bridging faults; testability concepts and applications; and fault modeling. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR
Label
VLSI Test Symposium, 12th IEEE, (electronic resource)
Instantiates
Publication
Control code
OCM1bookssj0000558972
Dimensions
29.000 x 022.000 cm.
Dimensions
unknown
Extent
488 pages
Governing access note
Available for distribution in: USA, UNITED KINGDOM
Isbn
9780818654404
Lccn
94075000
Other control number
9780818654404
http://library.link/vocab/ext/overdrive/overdriveId
5440
Specific material designation
remote
System control number
(WaSeSS)ssj0000558972
Label
VLSI Test Symposium, 12th IEEE, (electronic resource)
Publication
Control code
OCM1bookssj0000558972
Dimensions
29.000 x 022.000 cm.
Dimensions
unknown
Extent
488 pages
Governing access note
Available for distribution in: USA, UNITED KINGDOM
Isbn
9780818654404
Lccn
94075000
Other control number
9780818654404
http://library.link/vocab/ext/overdrive/overdriveId
5440
Specific material designation
remote
System control number
(WaSeSS)ssj0000558972

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      38.946102 -92.330125
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