The Resource VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
Resource Information
The item VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.This item is available to borrow from 1 library branch.
Resource Information
The item VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri Libraries.
This item is available to borrow from 1 library branch.
- Summary
- Sixty-two proceedings papers and eight panel sessions from the April 1997 symposium exploring the difficulties inherent in testing electronic systems and providing innovative solutions to those problems. The papers span the key testing areas such as core and processor testing, delay test and diagnosis, RAM testing, BIST, scan and boundary scan, current testing (IDDQ), analog and mixed signal testing, verification, and debugging. Additionally, new emerging processes were presented, describing thermal and elevated voltage tests, and power dissipation during test. Lacks an index. Annotation copyrighted by Book News, Inc., Portland, OR
- Language
- eng
- Extent
- 1 online resource (504 pages)
- Isbn
- 9780818678103
- Label
- VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
- Title
- VLSI Test Symposium, 15th IEEE (VTS '97)
- Title remainder
- Innovations in Test and Diagnosis: From Embedded Cores to Systems
- Language
- eng
- Summary
- Sixty-two proceedings papers and eight panel sessions from the April 1997 symposium exploring the difficulties inherent in testing electronic systems and providing innovative solutions to those problems. The papers span the key testing areas such as core and processor testing, delay test and diagnosis, RAM testing, BIST, scan and boundary scan, current testing (IDDQ), analog and mixed signal testing, verification, and debugging. Additionally, new emerging processes were presented, describing thermal and elevated voltage tests, and power dissipation during test. Lacks an index. Annotation copyrighted by Book News, Inc., Portland, OR
- Cataloging source
- COO
- Index
- no index present
- Language note
- English
- Literary form
- non fiction
- Nature of contents
- dictionaries
- http://library.link/vocab/subjectName
-
- Integrated circuits
- Integrated circuits
- Label
- VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
- Carrier category
- online resource
- Carrier category code
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 812656847
- Dimensions
- unknown
- Extent
- 1 online resource (504 pages)
- Form of item
- online
- Isbn
- 9780818678103
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
- c
- http://library.link/vocab/ext/overdrive/overdriveId
- pr07810
- Specific material designation
- remote
- System control number
- (OCoLC)812656847
- Label
- VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
- Carrier category
- online resource
- Carrier category code
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 812656847
- Dimensions
- unknown
- Extent
- 1 online resource (504 pages)
- Form of item
- online
- Isbn
- 9780818678103
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
- c
- http://library.link/vocab/ext/overdrive/overdriveId
- pr07810
- Specific material designation
- remote
- System control number
- (OCoLC)812656847
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/portal/VLSI-Test-Symposium-15th-IEEE-VTS-97-/vS3yZx3mChU/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/portal/VLSI-Test-Symposium-15th-IEEE-VTS-97-/vS3yZx3mChU/">VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
