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The Resource VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems

VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems

Label
VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
Title
VLSI Test Symposium, 15th IEEE (VTS '97)
Title remainder
Innovations in Test and Diagnosis: From Embedded Cores to Systems
Subject
Genre
Language
eng
Summary
Sixty-two proceedings papers and eight panel sessions from the April 1997 symposium exploring the difficulties inherent in testing electronic systems and providing innovative solutions to those problems. The papers span the key testing areas such as core and processor testing, delay test and diagnosis, RAM testing, BIST, scan and boundary scan, current testing (IDDQ), analog and mixed signal testing, verification, and debugging. Additionally, new emerging processes were presented, describing thermal and elevated voltage tests, and power dissipation during test. Lacks an index. Annotation copyrighted by Book News, Inc., Portland, OR
Member of
Is part of
Cataloging source
COO
Index
no index present
Language note
English
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
Label
VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
Instantiates
Publication
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
812656847
Dimensions
unknown
Extent
1 online resource (504 pages)
Form of item
online
Isbn
9780818678103
Media category
computer
Media MARC source
rdamedia
Media type code
c
http://library.link/vocab/ext/overdrive/overdriveId
pr07810
Specific material designation
remote
System control number
(OCoLC)812656847
Label
VLSI Test Symposium, 15th IEEE (VTS '97) : Innovations in Test and Diagnosis: From Embedded Cores to Systems
Publication
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
812656847
Dimensions
unknown
Extent
1 online resource (504 pages)
Form of item
online
Isbn
9780818678103
Media category
computer
Media MARC source
rdamedia
Media type code
c
http://library.link/vocab/ext/overdrive/overdriveId
pr07810
Specific material designation
remote
System control number
(OCoLC)812656847

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