Coverart for item
The Resource VLSI Test Symposium, 1995 IEEE, (electronic resource)

VLSI Test Symposium, 1995 IEEE, (electronic resource)

Label
VLSI Test Symposium, 1995 IEEE
Title
VLSI Test Symposium, 1995 IEEE
Creator
Author
Subject
Language
eng
Cataloging source
BIP US
Citation source
Sci-Tech BIP
http://bibfra.me/vocab/lite/organizationName
Institute of Electrical and Electronics Engineers, Inc. Staff
Label
VLSI Test Symposium, 1995 IEEE, (electronic resource)
Instantiates
Publication
Control code
OCM1bookssj0000558973
Dimensions
unknown
Extent
520 pages
Governing access note
Available for distribution in: USA, UNITED KINGDOM
Isbn
9780818670008
Other control number
9780818670008
http://library.link/vocab/ext/overdrive/overdriveId
pr07000
Specific material designation
remote
System control number
(WaSeSS)ssj0000558973
Label
VLSI Test Symposium, 1995 IEEE, (electronic resource)
Publication
Control code
OCM1bookssj0000558973
Dimensions
unknown
Extent
520 pages
Governing access note
Available for distribution in: USA, UNITED KINGDOM
Isbn
9780818670008
Other control number
9780818670008
http://library.link/vocab/ext/overdrive/overdriveId
pr07000
Specific material designation
remote
System control number
(WaSeSS)ssj0000558973

Library Locations

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      38.944491 -92.326012
    • Engineering Library & Technology CommonsBorrow it
      W2001 Lafferre Hall, Columbia, MO, 65211, US
      38.946102 -92.330125
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