Amsterdam | New York, North-Holland, New York, N.Y., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986
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The event Amsterdam | New York, North-Holland, New York, N.Y., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986 represents a publication, printing, distribution, issue, release or production of resources found in University of Missouri Libraries.
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Amsterdam | New York, North-Holland, New York, N.Y., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986
Resource Information
The event Amsterdam | New York, North-Holland, New York, N.Y., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986 represents a publication, printing, distribution, issue, release or production of resources found in University of Missouri Libraries.
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- 1986
7 Items that share the ProviderEvent Amsterdam | New York, North-Holland, New York, N.Y., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986
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- A mathematical introduction to Dirac's formalism, S.J.L. van Eijndhoven, J. de Graaf
- Approximation of continuously differentiable functions, José G. Llavona
- Aspects cellulaires et moléculaires de la biologie du développement : Cellular and molecular aspects of developmental biology, édité par Michel Fougereau et Raymond Stora ; conférenciers, Hubert Condamine [and others]
- Phénomènes critiques, systèmes aléatoires, théories de jauge : Critical phenomena, random systems, gauge theories, édité par Konrad Osterwalder et Raymond Stora ; conférenciers, David Brydges [and others]
- Phénomènes critiques, systèmes aléatoires, théories de jauge : Critical phenomena, random systems, gauge theories, édité par Konrad Osterwalder et Raymond Stora ; conférenciers, David Brydges [and others]
- Phénomènes critiques, systèmes aléatoires, théories de jauge : Critical phenomena, random systems, gauge theories, édité par Konrad Osterwalder et Raymond Stora ; conférenciers, David Brydges [and others]
- Reliability and quality control, edited by Asit P. Basu
- Transform analysis of generalized functions, O.P. Misra and J.L. Lavoine
- VLSI 85 : VLSI design of digital systems : proceedings of the IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, Tokyo, Japan, 26-28 August 1985, edited by E. Hörbst
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/resource/QVnTr9GyOhM/" typeof="PublicationEvent http://bibfra.me/vocab/lite/ProviderEvent"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/resource/QVnTr9GyOhM/">Amsterdam | New York, North-Holland, New York, N.Y., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>