Mustererkennung
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The concept Mustererkennung represents the subject, aboutness, idea or notion of resources found in University of Missouri Libraries.
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Mustererkennung
Resource Information
The concept Mustererkennung represents the subject, aboutness, idea or notion of resources found in University of Missouri Libraries.
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- Mustererkennung
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- swd
30 Items that share the Concept Mustererkennung
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- Advances in pattern recognition : Second Mexican Conference on Pattern Recognition, MCPR 2010, Puebla, Mexico, September 27-29, 2010 : proceedings
- Biometric systems : technology, design, and performance evaluation
- Combinatorial pattern matching : 6th annual symposium, CPM 95, Espoo, Finland, July 5-7, 1995 : proceedings
- Computational intelligence for knowledge-based systems design : 13th International Conference on Information Processing and Management of Uncertainty, IPMU 2010, Dortmund, Germany, June 28-July 2, 2010 ; proceedings
- Computer analysis of images and patterns : 13th international conference, CAIP 2009, Münster, Germany, September 2-4, 2009 : proceedings
- Computer analysis of images and patterns : 5th International Conference, CAIP '93, Budapest, Hungary, September 13-15, 1993 : proceedings
- Computer and information sciences : collected papers on learning, adaptation and control in information systems
- Computer vision/computer graphics, collaboration techniques : 4th international conference, MIRAGE 2009, Rocquencourt, France, May 4-6, 2009 ; proceedings
- Discrete wavelet transformations : an elementary approach with applications
- Energy minimization methods in computer vision and pattern recognition : 4th international workshop, EMMCVPR 2003, Lisbon, Portugal, July 7-9, 2003 : proceedings
- Fuzzy models and algorithms for pattern recognition and image processing
- Graph-based representations in pattern recognition : 5th IAPR international workshop, GbRPR 2005, Poitiers, France, April 11-13, 2005 : proceedings
- Graphics recognition : achievements, challenges, and evolution ; 8th international workshop, GREC 2009, La Rochelle, France, July 22-23, 2009 ; selected papers
- Groups and symmetry : a guide to discovering mathematics
- Information security applications : 4th International Workshop, WISA 2003, Jeju Island, Korea, August 25-27, 2003 : revised papers
- Les ondelettes en 1989 : Séminaire d'analyse harmonique, Université de Paris-Sud, Orsay
- Machine learning and data mining in pattern recognition : 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11, 2005 : proceedings
- Machine learning and data mining in pattern recognition : 6th international conference, MLDM 2009, Leipzig, Germany, July 23-25, 2009 : proceedings
- Multiple classifier systems : 6th international workshop, MCS 2005, Seaside, CA, USA, June 13-15, 2005 : proceedings
- Pattern recognition : 27th DAGM Symposium, Vienna, Austria, August 31-September 2, 2005 : proceedings
- Pattern recognition : 31st DAGM symposium, Jena, Germany, September 9-11, 2009 : proceedings
- Pattern recognition and machine intelligence : Third International Conference, PReMI 2009, New Delhi, India, December 16-20, 2009, proceedings
- Pattern recognition and machine intelligence : second international conference, PReMI 2007, Kolkata, India, December 18-22, 2007 : proceedings
- Pattern recognition and machine learning
- Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications : 14th Iberoamerican Conference on Pattern Recognition, CIARP 2009, Guadalajara, Jalisco, Mexico, November 15-18, 2009. Proceedings
- Progress in pattern recognition, image analysis, computer vision, and applications : 15th Iberoamerican Congress on Pattern Recognition, CIARP 2010, São Paulo, Brazil, November 8-11, 2010 : proceedings
- Progress in pattern recognition, speech and image analysis : 8th Iberoamerican Congress on Pattern Recognition, CIARP 2003, Havana, Cuba, November 26-29, 2003 : proceedings
- Rough sets and current trends in computing : second international conference, RSCTC 2000, Banff, Canada, October 16-19, 2000 : revised papers
- Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010 : proceedings
- Structure discovery in natural language
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/resource/RM0500AVpkY/" typeof="CategoryCode http://bibfra.me/vocab/lite/Concept"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/resource/RM0500AVpkY/">Mustererkennung</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/resource/RM0500AVpkY/" typeof="CategoryCode http://bibfra.me/vocab/lite/Concept"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/resource/RM0500AVpkY/">Mustererkennung</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
