26th IEEE VLSI Test Symposium : proceedings : San Diego, California, 27 April - 1 May 2008

Resource Information

The work 26th IEEE VLSI Test Symposium : proceedings : San Diego, California, 27 April - 1 May 2008 represents a distinct intellectual or artistic creation found in University of Missouri Libraries. This resource is a combination of several types including: Work, Language Material, Books, http://bibfra.me/vocab/marc/conference-publication.

Label

26th IEEE VLSI Test Symposium : proceedings : San Diego, California, 27 April - 1 May 2008

Title remainder

proceedings : San Diego, California, 27 April - 1 May 2008

Statement of responsibility

[sponsored by] IEEE Computer Society

Title variation

• Twenty sixth IEEE VLSI Test Symposium
• VLSI Test Symposium
• VTS 2008
• VTS 08
• VLSI Test Symposium, 2008, VTS 2008, 26th IEEE

Creator

• IEEE VLSI Test Symposium, 2008

Contributor

• IEEE Computer Society, Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers

Subject

• Conference papers and proceedings
• Integrated circuits -- Very large scale integration | Testing -- Congresses
• Integrated circuits -- Very large scale integration | Testing

Genre

• Congresses
• Conference papers and proceedings

Language

eng

Member of

• IEEE/IET Electronic Library

Cataloging source

AZU

Illustrations

illustrations

Index

index present

LC call number

TK7874

LC item number

.I32385 2008

Literary form

non fiction

Nature of contents

• dictionaries
• bibliography