Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China

Resource Information

The work Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China represents a distinct intellectual or artistic creation found in University of Missouri Libraries. This resource is a combination of several types including: Work, Language Material, Books, http://bibfra.me/vocab/marc/conference-publication.

Label

Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China

Title remainder

selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China

Statement of responsibility

edited by Yanwen Wu

Title variation

• International Conference on Advanced Measurement and Test
• AMT 2010
• Advanced Measurement and Test X

Creator

• International Conference on Advanced Measurement and Test, 2010

Contributor

• Wu, Yanwen

Subject

• Electric measurements -- Congresses
• Electronic books
• Electronic bookss
• Electronic measurements -- Congresses
• Materials -- Testing -- Congresses
• Conference papers and proceedings

Genre

• Electronic books
• Electronic bookss
• Congresses
• Conference papers and proceedings

Language

eng

Member of

• Key engineering materials, v. 439-440

Cataloging source

MUU

Illustrations

illustrations

Index

index present

LC call number

TA1

LC item number

.K5 v.439-440

Literary form

non fiction

Nature of contents

• dictionaries
• bibliography

Series statement

Key engineering materials,

Series volume

v. 439-440