Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
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The work Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China represents a distinct intellectual or artistic creation found in University of Missouri Libraries. This resource is a combination of several types including: Work, Language Material, Books, http://bibfra.me/vocab/marc/conference-publication.
The Resource
Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
Resource Information
The work Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China represents a distinct intellectual or artistic creation found in University of Missouri Libraries. This resource is a combination of several types including: Work, Language Material, Books, http://bibfra.me/vocab/marc/conference-publication.
- Label
- Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
- Title remainder
- selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
- Statement of responsibility
- edited by Yanwen Wu
- Title variation
-
- International Conference on Advanced Measurement and Test
- AMT 2010
- Advanced Measurement and Test X
- Language
- eng
- Cataloging source
- MUU
- Illustrations
- illustrations
- Index
- index present
- LC call number
- TA1
- LC item number
- .K5 v.439-440
- Literary form
- non fiction
- Nature of contents
-
- dictionaries
- bibliography
- Series statement
- Key engineering materials,
- Series volume
- v. 439-440
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