Context

Context of Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia, edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.], (electronic resource)
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