Integrated circuits -- Testing
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The concept Integrated circuits -- Testing represents the subject, aboutness, idea or notion of resources found in University of Missouri Libraries.
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Integrated circuits -- Testing
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The concept Integrated circuits -- Testing represents the subject, aboutness, idea or notion of resources found in University of Missouri Libraries.
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164 Items that share the Concept Integrated circuits -- Testing
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- ... East-West Design and Test Symposium
- ... IEEE ... International Symposium on Design and Diagnostics of Electronic Circuits & Systems
- 15th International Workshop on Microprocessor Test and Verification : MTV 2014 : proceedings : 15-16 December 2014, Austin, Texas, USA
- 16th International Reliability Physics Symposium
- 16th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2009 proceedings : 6 to 10 July 2009, Suzhou Industrial Park, Suzhou, China
- 17th International Reliability Physics Symposium
- 18th International Reliability Physics Symposium
- 1997 IEEE International Conference on Microelectronic Test Structures Proceedings
- 1998 IEEE International Reliability Physics Symposium
- 2000 IEEE International Conference on Microelectronic Test Structures
- 2000 International Test Conference
- 2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
- 2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006
- 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan
- 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era : proceedings : September 2-5, 2007, Rabat, Marocco [i.e. Morocco]
- 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems
- 2008 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 24-27, the University of Edinburgh, UK
- 2008 Third International Design & Test Workshop (IDT 2008) : proceedings : Monastir, Tunisia, December 20-22, 2008
- 2010 International Conference on Microelectronic Test Structures : 23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan
- 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
- 2011 IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
- 2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL
- 2012 IEEE International Conference on Microelectronic Test Structures : ICMTS 2012 : Catamaran Resort & Hotel, San Diego, California, March 20-22, 2012
- 2013 8th International Design and Test Symposium (IDT)
- 2013 IEEE International Conference on Microelectronic Test Structures : conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan
- 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : DTIS 2014 : proceedings : May 6th-8th 2014, Santorini, Greece
- 2014 IEEE International Test Conference (ITC) : proceedings : October 21-23, 2014, Washington State Convention Center, Seattle, Washington, USA
- 2015 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : DTIS 2015 : proceedings : April 21th-23th 2015, Naples, Italy
- 2015 16th International Workshop on Microprocessor and SOC Test and Verification : MTV 2015 : proceedings : Austin, Texas, United States, 3-4 December 2015
- 2015 IEEE International Test Conference (ITC) : proceedings
- 2016 11th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : DTIS 2016 : proceedings : April 12th-14th 2016, Istanbul, Turkey
- 2016 IEEE 25th North Atlantic Test Workshop : NATW 2016 : proceedings : Providence, Rhode Island, USA, 9-11 May 2016
- 2016 IEEE International Test Conference (ITC) : date, 15-17 Nov. 2016
- 2016 International Conference on Microelectronic Test Structures : 29th IEEE ICMTS conference proceedings : March 28-31, Mielparque, Yokohama, Japan
- 2017 12th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : DTIS 2017 : proceedings : April 4th-6th 2017, Palma de Mallorca, Spain
- 2017 International Conference of Microelectronic Test Structures (ICMTS) : 27-30 March 2017
- 2018 13th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : DTIS 2018 : proceedings : April 10th-12th, 2018, Taormina, Italy
- 2019 14th IEEE International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) : DTIS 2019 : proceedings : April 16th-18th, 2019, Mykonos, Greece
- 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan
- 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017) : 4 July 7 - July 2017, Chengdu, China
- 25th International Symposium on the Phyisical and Failure Analysis of Integrated Circuits : 16-19 July 2018, Marina Bay Sands, Singapore
- 26th North Atlantic Test Workshop : May 8-10, 2017, Providence, Rhode Island
- 28th North Atlantic Test Workshop : May 13-15, 2019, Essex Resort & Spa, Essex, Vermont
- 4th International Workshop on Microprocessor Test and Verification : common challenges and solutions, MTV 2003 : proceedings : Hyatt Town Lake Hotel, Austin, Texas, May 29-30, 2003
- 5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004
- 8th Reliability Physics Symposium
- Colloquium on "Testing Mixed Signal Circuits" : on Friday, 15 May 1992
- Colloquium on Testing Mixed Signal Circuits and Systems : Savoy Place, London, Thursday, 23 October 1997
- DTIS '09 : proceedings : 2009 4th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era : April 6-7, 2009, Four Seasons Hotel, Nile Plaza, Cairo, Egypt
- DTIS 2010 : 5th international conference on design & technology of integrated systems in nanoscale era : March 23-25, 2010, Hammamet, Tunisia
- DTIS 2011 : 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era : technical report : April 6-8, 2011, Athens, Greece
- DTIS 2012 : 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, May 16-18, 2012, Gammarth, Tunisia
- Design and Technology of Integrated Systems in Nanoscale Era, 2008, DTIS 2008, 3rd International Conference on
- Design and Test Workshop (IDT), 2011 IEEE 6th International : date, 11-14 Dec. 2011
- Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings : October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
- Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
- EDAC '94/ETC '94/Euro ASIC '94 - European Design and Test Conference
- ELECTRO 99 : proceedings of the technical program : conference, June 15-16, 1999, exhibition, June 15-17, 1999, Bayside Exposition Center, Boston, Massachusetts
- ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings
- ETS '10 : 2010 15th IEEE European Test Symposium (ETS) : May 24-28, 2010, Prague, Czech Republic
- ETS 2004 : Ninth IEEE European Test Symposium : proceedings : 23-26 May, 2004, Corsica, France
- ETS 2007 : 12th IEEE European Test Symposium : proceedings : 20-24 May 2007, Freiburg, Germany
- ETS 2009 : European Test Symposium : proceedings, 25-29 May, 2009, Sevilla, Spain
- ETW'02 : the Seventh IEEE European Test Workshop : proceedings : 26-29 May, 2002, Corfu, Greece
- Eleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom
- European Design and Test Conference, 1996. ED & TC 96. Proceedings
- European Test Conference, 1st, 1989 (ETC 89) : Proceedings
- European Test Symposium : ETS 2005 : proceedings : 22-25 May, 2005, [Reval Hotel Olümpia] Tallin, Estonia
- European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany
- Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
- Hardware and software, verification and testing : 5th International Haifa Verification Conference, HCV 2009, Haifa, Israel, October 19-22, 2009 : revised selected papers
- ICDV 2017 : proceedings of 2017 7th International Conference on Integrated Circuits, Design, and Verification : October 5-6, 2017, Hanoi, Vietnam
- ICMTS 1990 : proceedings of the 1990 International Conference on Microelectronic Test Structures : March 5-7, 1990, San Diego, Calif.
- ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
- ICMTS 2001 : proceedings of the 2001 International Conference on Microelectronic Test Structures : March 19-22, 2001, Kobe, Japan
- ICMTS 2002 : proceedings of the 2002 International Conference on Microelectronic Test Structures : April 8-11, 2002, Cork, Ireland
- ICMTS 2003 : proceedings of the 2003 International Conference on Microelectronic Test Structures : March 17-20, 2003, Double Tree Hotel, Monterey, California
- ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
- ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium
- ICMTS 2006 : proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006
- ICMTS 2009 : 2009 IEEE International Conference on Microelectronic Test Structures : Embassy Suites, Mandalay Beach Hotel, Oxnard, CA, March 31-April 2, 2009
- ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona
- ICMTS 2018 : proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures : 31st ICMTS : March 19-22, 2018, Courtyard by Marriott Austin Downtown/Convention Center, Austin, Texas, USA
- IDT '10 : proceedings : 2010 5th International Design and Test Workshop : 14-15 December 2010, Fairmont Bab Al Bahr Hotel, [Abu Dhabi, UAE]
- IEEE 23rd North Atlantic Test Workshop : proceedings : 14-16 May 2014, Binghampton, New York
- IEEE European Test Workshop : proceedings : 23-26 May, 2000, Cascais, Portugal
- IEEE European Test Workshop : proceedings : 29 May-1 June, 2001, Stockholm, Sweden
- IEEE International Conference on Microelectronic Test Structures 1994
- IEEE International Conference on Microelectronic Test Structures Proceedings
- IEEE International Conference on Microelectronic Test Structures Proceedings, 1999
- IEEE International Conference on Microelectronic Test Structures, 1991
- IEEE International Conference on Microelectronic Test Structures, 1992
- IEEE International Conference on Microelectronic Test Structures, 1993
- IPFA 2010 : 17th International Symposium on the Physical & Failure Analysis of Integrated Circuits : 5-9 July 2010, Suntec Singapore International Convention and Exhibition Centre, Singapore
- ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
- ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
- ITC-Asia 2017 : International Test Conference in Asia : TWTC Nangang Exhibition Hall, Taipei City, Taiwan, Sep 13-15, 2017
- ITC-Asia 2018 : 2nd IEEE International Test Conference in Asia : proceedings : 15-17 August 2018, Harbin, China
- Integrated circuit and system design : power and timing modeling, optimization and simulation, 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008 : revised selected papers
- International Test Conference 2003 : proceedings
- International Test Conference 2009 : proceedings : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas, USA
- International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA
- International Test Conference 2011 : [42nd] Proceedings : September 18-23, 2011 : Disneyland Hotel, Anaheim, California USA
- International Test Conference 2012 : [43rd] Proceedings : November 6-8, 2012 : Disneyland Hotel, Anaheim, California USA
- International Test Conference 2017 : proceedings : October 31 - November 2, 2017, Fort Worth Convention Center, Fort Worth, Texas USA
- International Test Conference 2018 : proceedings : October 29 - November 1, 2018, Phoenix Convention Center, Phoenix, Arizona USA
- International Test Conference, 1991 : proceedings
- MTV 2007 : Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA
- MTV 2008 : Ninth International Workshop on Microprocessor Test and Verification : proceedings, 8-10 December 2008, Austin, Texas, USA
- MTV 2009 : 10th International Workshop on Microprocessor Test and Verification : proceedings, 7-9 December 2009, Austin, TX, USA
- Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC
- New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
- Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the : date: 2-6 July 2012
- Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2008
- Proceedings
- Proceedings
- Proceedings : International Test Conference 1994
- Proceedings : International Test Conference 1995
- Proceedings : International Test Conference 1996
- Proceedings : International Test Conference 1997
- Proceedings : eight IEEE European Test Workshop : 25-28 May, 2003, Maastricht, the Netherlands
- Proceedings International Test Conference 2002
- Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016
- Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS) : Novi Sad, Serbia, September 27 - October 2, 2017
- Proceedings of 2018 IEEE East-West Design & Test Symposium (EWDTS) : Kazan, Russia, September 14-17, 2018
- Proceedings of 2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA 2018) : 21-23 November 2018, Beijing China
- Proceedings of 2019 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) : 13-15 November 2019, Chengdu China
- Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
- Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled: 7 to 11 July, 2003, Singapore]
- Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2004
- Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's Rasa Sentosa Resort, Singapore]
- Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
- Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2006
- Proceedings of the 13th International Workshop on Microprocessor Test and Verification : 10-12 December 2012, Austin, Texas, USA
- Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007
- Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
- Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore]
- Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 : 5-9 July, 1999, Orchard Hotel, Singapore]
- Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2006, Prague, Czech Republic
- Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 11-13, 2007, Kraków, Poland
- Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 15-17, 2009, Liberec, Czech Republic
- Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : April 18-20, 2012, Tallinn, Estonia
- Proceedings of the 2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
- Proceedings of the 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 8-10, 2013, Karlovy Vary, Czech Republic
- Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 18-21 July 2016, Marina Bay Sand, Singapore
- Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Proceedings, 16TH IEEE European Test Symposium : ETS 2011 : 23-27 May 2011, Trondheim, Norway
- Proceedings, 2009 Fourth International Design and Test Workshop (IDT 2009) : November 15-17 2009, Riyadh Intercontinental Hotel, Riyadh
- Proceedings, 2012 17th IEEE European Test Symposium (ETS) : ETS 2012 : May 28th-June 1st 2012, Annecy, France
- Proceedings, 2013 18th IEEE European Test Symposium (ETS) : ETS 2013 : May 27th-30th 2013, Avignon, France
- Proceedings, 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems : DDECS 2015 : 22-24 April 2015, Belgrade, Serbia
- Proceedings, 2016 21st IEEE European Test Symposium (ETS) : ETS 2016 : May 23rd-26th 2016, Amsterdam, the Netherlands
- Proceedings, 2017 22nd IEEE European Test Symposium (ETS) : ETS 2017 : May 22nd-26th 2017, Limassol, Cyprus
- Proceedings, 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems (DDECS) : 19th until 21st of April, Dresden, Germany
- Proceedings, 2019 IEEE European Test Symposium (ETS) : ETS 2019 : May 27-31, 2019, Baden Baden, Germany
- Proceedings, Eleventh International Workshop on Microprocessor Test and Verification : 13-15 December 2010, Austin, TX, USA
- Proceedings, International Test Conference 1998
- Proceedings, International Test Conference 1999
- Proceedings, Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May, 2008, Verbania, Italy : proceedings
- Reliability physics
- Seventh International Workshop on Microprocessor Test and Verification : proceedings : MTV 2006 : Austin, Texas, 4-5 December, 2006
- Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005
- The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.missouri.edu/resource/rJr3sWJREBI/" typeof="CategoryCode http://bibfra.me/vocab/lite/Concept"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.missouri.edu/resource/rJr3sWJREBI/">Integrated circuits -- Testing</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.missouri.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.missouri.edu/">University of Missouri Libraries</a></span></span></span></span></div>
